determination of porous silicon thermal conductivity using the “mirage effect” method

Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...

Determination of porous Silicon thermal conductivity using the “Mirage effect” method

Mirage effect is contactless and non destructive method which has been used a lot to determine thermal properties of different  kind of samples , transverse photothermal deflection PTD in  skimming configuration with ccd camera  and special programs is used to determine thermal conductivity of porous silicon ps  film. Ps samples were prepared by electrochemical etching. Thermal conductivity wit...

Thermal conductivity in porous silicon nanowire arrays

The nanoscale features in silicon nanowires (SiNWs) can suppress phonon propagation and strongly reduce their thermal conductivities compared to the bulk value. This work measures the thermal conductivity along the axial direction of SiNW arrays with varying nanowire diameters, doping concentrations, surface roughness, and internal porosities using nanosecond transient thermoreflectance. For Si...

buckling of viscoelastic composite plates using the finite strip method

در سال های اخیر، تقاضای استفاده از تئوری خطی ویسکوالاستیسیته بیشتر شده است. با افزایش استفاده از کامپوزیت های پیشرفته در صنایع هوایی و همچنین استفاده روزافزون از مواد پلیمری، اهمیت روش های دقیق طراحی و تحلیل چنین ساختارهایی بیشتر شده است. این مواد جدید از خودشان رفتارهای مکانیکی ارائه می دهند که با تئوری های الاستیسیته و ویسکوزیته، نمی توان آن ها را توصیف کرد. این مواد، خواص ویسکوالاستیک دارند....

The interferometric mirage effect method: The determination of the thermal diffusivity of CdMnTe

A Michelson interferometer was used as a precise detector in the Mirage effect configuration in order to determine the thermal diffusivity of the diluted rnagnetic semiconductor Cd, -,Mn,Te, in the concentration range O<x<0.6 at roorn ternperature. This zinc-blende temary alloy exhibits an alrnost linear behavior of the thermal diffusivity as a function of Mn concentration. This trend is simila...

A Method for the Numerical Determination of Thermal Conductivity